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Hsinchu, Taiwan – May 6, 2025 —Compound semiconductor materials such as silicon carbide (SiC) and gallium nitride (GaN) are core technologies in automotive semiconductors and power management ICs. These materials are widely applied in electric vehicles, energy storage systems, data centers, 5G, and aerospace, driving a comprehensive upgrade in high-temperature, high-voltage, high-current, high-speed, and high-frequency testing, packaging, and process automation technologies. In collaboration with global automated test leader Teradyne and National Yang-Ming Chiao Tung University, ACE Solution hosted the "Compound Semiconductor Testing Technology and Automation Forum" on April 30. The event brought together experts from industry, academia, and research institutions to explore application trends, testing fixtures, and automation solutions. In his opening remarks, Tony Hsu, Vice President of Marketing at ACE Solution, emphasized the strategic importance of power systems in next-generation technologies: " As electric vehicles (EVs), 5G communications, high-performance computing (HPC), and AI servers continue to develop rapidly, the ability to deliver stable and high-performance power—along with advancements in power buffering, power delivery systems, and battery management—has become a critical challenge for industrial transformation. In response to global shifts and industry needs, ACE Solution remains committed to deepening its expertise in testing and automation. We look forward to working with experts across diverse sectors to drive innovation and accelerate the industry's upgrade." The forum featured a distinguished lineup of speakers who shared insights into the full technology chain, from semiconductor testing to smart manufacturing. Dr. Hsiao Yi-Kai, Team Leader at Foxconn, delivered a presentation titled "SiC in the AI Era: Intelligent Design Accelerates Power Technology Innovation," providing an in-depth look at key silicon carbide (SiC) applications in the AI-driven age. Jason Hsieh, Sales Manager at ACE Solution, shared his perspective on "Compound Semiconductor Trends & High-Power Testing Innovations," highlighting how evolving device architectures shape testing demands. Dr. Harry Kuan, R&D Manager at ACE Solution, addressed "Compound Semiconductor Wafer Testing and Advanced 3D Package Failure Analysis," showcasing advanced diagnostic techniques for next-generation packaging. Edward Weng, Product Marketing Manager at Onsemi, presented a case study on applying DrWBG technology in AI servers, illustrating how compound semiconductors reshape computing infrastructure. Kenny Wang, Business Development Manager at Teradyne Robotics, concluded the event with his talk "Building a Stable, Unmanned Delivery Network with MiR," outlining how robotics and automation are paving the way for smart semiconductor manufacturing. In addition to the insightful presentations, the event also featured three major technology showcases: High-Power Analog and Mixed-Signal Testing Solutions, Wafer Materials, and 3DIC Non-Destructive Testing, and Semiconductor Collaborative Robots Automation, all of which received enthusiastic responses from attendees. ACE Solution has partnered with Teradyne to jointly develop the ETS testing solution to address the challenges of precise testing for high-power components, 3DIC packaging inspection, and improving production efficiency. This collaboration successfully overcomes the limitations of high-power analog and mixed-signal testing. In addition, ACE Solution utilizes terahertz technology for non-destructive inspection of wafer materials and 3DIC packaging, offering a comprehensive suite of capabilities ranging from materials analysis (MA) and failure analysis (FA) to automotive semiconductor validation. For smart manufacturing, ACE Solution also provides automated solutions using UR/MiR collaborative robots, enabling industry partners to transition from R&D to mass production seamlessly. These innovations significantly enhance process efficiency and accuracy while reducing labor demands and overall costs. ACE Solution remains committed to deepening collaborations with strategic partners across the compound semiconductor value chain, joining academia, industry, and government forces to build a globally integrated ecosystem. For media inquiries, please contact: ADVANCED COMM.ENGINEERING SOLUTION CO., LTD. Jenny Lin Address: 2F-1, No.28, Taiyuan street, Jhubei City, Hsinchu County, 302, Taiwan Telephone: +886 3 5500909 #3407 E-mail: pr@acesolution.com.tw Website: https://www.acesolution.com.tw/en/ About ACE Solution Established in 2000, ACE Solution (https://www.acesolution.com.tw/en/) is headquartered in Hsinchu City, Taiwan, with branch offices strategically located in Suzhou and Shenzhen, China. Our company is dedicated to delivering tailored test solutions that cater to the specific requirements of our customers in the field of electrical components, devices, and system manufacturing. Furthermore, we collaborate with our esteemed partners to provide comprehensive technology solutions. At ACE Solution, we specialize in RF, mmWave, and terahertz technologies, boasting an accomplished team of technical experts who offer unparalleled support. Our commitment to professionalism, innovation, and versatility enables us to offer cutting-edge integrated techniques and solutions. By leveraging our expertise, we empower our clients to overcome technological challenges and achieve their desired outcomes efficiently and effectively.
筑波科技 (ACE Solution) 攜手美商泰瑞達 (Teradyne)，於2024年11月14日成功舉辦年度壓軸「化合物半導體與矽光子技術研討會」。本次活動由國立陽明交通大學、中原大學電子工程學系共同主辦，打造產官學交流平台。主題涵蓋Teradyne ETS高功率類比與混合訊號測試，適用於晶片探測 (CP)、良品晶片 (KGD)、功率器件 (PD)、功率模組 (PM) 等多樣需求。同時，矽光子結合半導體應用提供優化測試支援。太赫茲非破壞性檢測技術則適用於材料及晶圓測試及高階封裝的非破壞性測試方案。 此次特別融入半導體自動化應用，包括協作型機器人及自主移動機器人整合方案，靈活應用於智慧製造環境，提升操作效率並降低人力成本。隨著電動車及新能源市場需求增長，化合物半導體材料如碳化矽 (SiC) 和氮化鎵 (GaN)，其高頻率、耐高壓及優異的散熱性能，成為車用半導體及電源管理IC關鍵技術。筑波科技攜手泰瑞達推廣ETS，提供業界最高規格功率IC測試平台可支持達6000V和4000A測試，應對高電流、高電壓需求。也應用太赫茲檢測技術，滿足非破壞性晶圓材料及3DIC高階封裝測試需求，涵蓋從研發到量產的製程管理，提升效率並減少潛在風險。 活動開幕引言由筑波科技許深福董事長致詞：「因應化合物半導體及車用市場需求，筑波科技致力於跨足產業鏈，專注提供彈性系統整合測試方案，引進協作手臂自走車，推動半導體產業的工廠自動化。很榮幸邀請來自全球的專家學者共同參與，期望創造更大的合作效益。」在上半場活動，由筑波科技工程部專案經理邱世耀介紹ETS測試系統在高功率類比與混合訊號測試上的應用，SEMI Taiwan/陽明交大光電所教授郭浩中則分享矽光子技術在AI Data Center前景。日本九州大學系統資訊科學研究生院資訊電子學系加藤和利教授也專題探討化合物半導體光混頻器於太赫茲波應用成果。會場提供四大展示體驗站，包括高功率類比與混合訊號測試方案、矽光子光電整合測試模組方案、晶圓及材料非破壞性測試方案，及UR與MiR的整合解決方案。 下半場活動由合晶科技新產品技術處資深處長徐文浩探討氮化鎵基板材料的創新應用，筑波科技總經理徐舜範分享UR (協作型機器人) 與 MiR (自主移動機器人) 半導體自動化應用，系統整合專案經理吳煜坤則介紹PXIE介面提升矽光子光電整合測試效率、相干光技術及多通道解決方案。最後，專案經理許永周講解化合物半導體材料晶圓及3DIC測試。 筑波科技期盼未來能與更多客戶及合作夥伴攜手合作，可提供完整測試與自動化解決方案，共同推動產業創新，拓展商業契機與市場機會。 聯絡筑波科技 筑波科技股份有限公司ACE Solution, Co., Ltd. 地址：新竹縣竹北市台元街28號2樓之1 電話：03-5500909 電子郵件：service@acesolution.com.tw 網站：https://www.acesolution.com.tw/en/index/ 關於筑波科技（ACE Solution） 筑波科技（https://www.acesolution.com.tw/en/index/）成立於2000年，位於台灣新竹，在中國蘇州和深圳設有分公司。我們的使命是提供訂製的測試解決方案，以滿足電氣元件、設備和系統製造商的客戶需求，通過合作夥伴提供技術解決方案。我們專注於射頻、毫米波和太赫茲領域，擁有專業的技術支援團隊，提供專業、創新和多功能的綜合技術和解決方案。
A12 藝術空間
high-power testing
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